Filmetrics F10-HC Film Thickness Measuring instrument
Product Introduction of Filmetrics F10-HC Film Thickness Measuring Instrument
Filmetrics F10-HC The film thickness measuring instrument isFilmetrics F20 White light interferometer film thickness gaugeIt has developed based on this foundation.F10-HC Film thickness measurement systemThe unique contact probe significantly reduces the impact of reflected interference.It can quickly analyze the reflection spectral data of thin films and provide thickness measurementFilmetrics F10-HC Film Thickness Measuring instrumentThe design of the software's simulation algorithm enables the measurement of single and multiple layers in thick films(For example: primer or hard coating, etc).
Product features and advantages of Filmetrics F10-HC Film Thickness Measuring instrument
A film measurement system with a price advantage;
It has a simple operating system and a new template mode functionF10-HCThe film thickness gauge automatically notifies the measurement result.
Automate benchmark correction and set your own integration time;
The unique contact probe significantly reduces the impact of reflected interference.
The measurement principle of the Filmetrics F10-HC film thickness gauge product:
When incident light passes through the interfaces of different substances, some of the light will be reflected. Due to the wave nature of light, the reflected light from multiple interfaces interferes with each other, causing the multi-wavelength spectrum of the reflected light to oscillate. From the oscillation frequency of the spectrum, the distance between different interfaces can be determined, and thus the thickness of the material can be obtained (the more oscillations, the greater the thickness). At the same time, other material properties such as refractive index and roughness can also be obtained.
Filmetrics F10-HC Film Thickness Measuring Instrument Product Application and film layer examples:
Detection of diaphragm thicknessThe thickness of the sound membrane is measured by calculating the reflectance information. A contact probe is used to reduce the influence of backside reflection and better measure the uneven and irregular surface of the membrane.
Product parameters of Filmetrics F10-HC Film Thickness Measuring Instrument
Wavelength range | 380nm-1050nm | Light source | Tungsten halogen lamp |
Thickness measurement range | 0.05 mu m - 70 microns | Measurement accuracy | 0.01 mu m |
Spot size | 200 microns | Stability | 0.01 mu m |
For more parameters, please contact us |
Measurement diagram of Filmetrics F10-HC Film thickness measuring instrument
